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在1965年戈登·摩尔发表举世闻名的“摩尔定律”,预测集成电路的晶体管数目每隔18个月增加一倍。三十五年来,集成电路历经小规模、中规模、大规模、超大规模至特大规模的发展,证明该定律的正确性,而且在二十一年纪的头十年该定律仍然有效。可以预期,2000年将开发成集成度达1亿个晶体管的微处理器,2010年集成度达到10亿个晶体管的微处理器。集成电路的集成度越高,芯片的成本也越高,电路设计和生产过程中任何疏漏,都影响最终成品率。质量的保证由每个环节的测试仪器把关,芯片封装前后的测试更为重要。进入新千年之际,集成电路测试业面临有三个值得注意的问题,它们是: 1.速度与精度;
In 1965 Gordon Moore published the world-famous “Moore’s Law,” predicting the number of transistors in integrated circuits to double every 18 months. For 35 years, the small and medium scale, large-scale, ultra-large-scale to very large-scale development of integrated circuits has proved the correctness of the law and the law is still valid for the first decade of the 21st century. It is expected that in 2000, it will develop into a microprocessor with 100 million integrated transistors and a microprocessor with 1 billion integrated transistors in 2010. The higher the integration of integrated circuits, the higher the cost of the chip, circuit design and any omission in the production process, will affect the final yield. Quality assurance checks by each part of the test equipment, chip packaging before and after the test is more important. Into the new millennium, the IC testing industry faces three notable issues, they are: 1. Speed and accuracy;