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对于光谱分析定量测定多种元素,光谱工作者做了不少工作,但都局限于一般的测定含量范围,实际用于生产者不多。本文主要报道应用撒样法光谱测定南岭钨矿赋存层中的一些重要微量元素及其分析结果,旨在为研究钨矿成矿规律及其找矿方向提供必要的测试数据。地质工作者要求分析灵敏度达到1或0.5ppm。我们在现有仪器设备基础上挖潜改造,以二氧化硅、碳粉作缓冲剂,二米平面光栅摄谱仪撒样法一次摄谱,同时测定七种元素,分析灵敏度达到:W 0.1—0.5
For the quantitative analysis of a wide range of elements in spectroscopic analysis, spectrum workers have done a lot of work, but are limited to the general determination of the content range, the actual use of small producers. In this paper, we mainly report the determination of some important trace elements in the Nanling tungsten deposit by using scatter spectroscopy, and provide the necessary test data for studying the metallogenic regularity and prospecting direction of tungsten ore. Geological workers require analytical sensitivity of 1 or 0.5 ppm. Based on the existing equipment and equipment, we tapped the potential transformation and took silicon dioxide and carbon powder as the buffer. The two-dimensional plane grating spectrograph scatter sample once, and the seven elements were measured simultaneously. The analytical sensitivity was as follows: W 0.1-0.5