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发射光谱光电直读(简称“光电法”)直接分析固体样品,具有快速、准确、多元素同时测定等优点,但以往的方法,灵敏度都比较低。鹿岛次郎等报导,光电法直接测定高纯铝固体样品中的Fe、Si和Cu时,它们的分析含量范围分别为0.001—1.5％,0.001—2.0％和0.001—1.0％,当它们的含量低于0.01时,分析精度(相对均方偏差)为10％.美国利用1.5米或20米光栅光电直读光谱仪分析上述含量元素时,所得的工作曲线形状是非线性的。
Emission Spectral Optical Direct Reading (“Optoelectronic”) direct analysis of solid samples with fast, accurate, simultaneous determination of multiple elements and other advantages, but the previous method, the sensitivity is relatively low. Kashima Jiro and other reports, the photoelectric method for the direct determination of high purity aluminum solid samples of Fe, Si and Cu, the analytical range of their content were 0.001-1.5%, 0.001-2.0% and 0.001-1.0%, respectively, when their content When less than 0.01, the analysis accuracy (relative mean square deviation) is 10% .When the above-mentioned content elements are analyzed by the United States using a 1.5-meter or 20-meter grating photoelectric direct reading spectrometer, the shape of the working curve obtained is nonlinear.