采用真空蒸镀的方法在玻璃、石英和硅衬底上制备了Ｃ６０／７０薄膜样品，膜厚范围在１５０～７００ｎｍ．用自制的高精度、自动化光度法椭偏光谱仪在２３０～６００ｎｍ波谱范围内测量了掺碘前后Ｃ６０／７０薄膜的椭偏光谱．用洛伦兹振子模型分析了这些椭偏光谱，得到了洛伦兹线型参数值Ｅ０、Ｅｐ、和Γ，并与有关Ｃ６０／７０掺钾的文献进行了比较 C60 / 70 thin film samples were prepared on glass, quartz and silicon substrates by vacuum evaporation. The film thickness ranged from 150 nm to 700 nm. The spectroscopic ellipsometry of C60 / 70 thin films before and after iodine doping was measured in a wavelength range of 230-600 nm by using a homemade high-precision and automated photometric ellipsometry. These ellipsometric spectra were analyzed using the Lorentz oscillator model, and the Lorentzian linear parameter values ​​E0, Ep, and Γ were obtained and compared with references on the C60 / 70 doped potassium