用于透射电子显微镜观察的样品，常常因曝露于大气中受到氧、水汽及大气压的作用，使原有的初始状态发生变化。现代的电子显微镜的分辨已达到原子量级，如果存在上述问题，即使是很轻微，也会影响到图象的质量。因此，实现从样品制备到送至电子显微镜中观察的整个过程中，使样 Samples for transmission electron microscopy are often subject to changes in the original initial state due to exposure to the atmosphere by exposure to oxygen, water vapor and atmospheric pressure. Modern electronic microscope resolution has reached the atomic level, if the existence of the above problems, even if very slight, will also affect the quality of the image. Therefore, to achieve from the sample preparation to send electron microscopy observation of the entire process, the sample