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随着光电技术的发展,各种光学半透明薄膜在实际中得到了广泛应用。光学薄膜的使用必须建立在光学特性(如透射率、反射率和吸收率)已知的基础之上。一般而言,对于半透薄膜透射率的测量比较简单,而对于反射率和吸收率的测量往往比较复杂。本文在总结前人研究薄膜光学特性测量经验的基础之上,通过分析光路在多层薄膜间的传递过程,设计了一种利用辐射计有效测量半透薄膜光学特性的方法,测量简便、快速,可直接得到测量波段内薄膜的半球光学特性参数。在待测薄膜光学特性比较极端(透射率、反射率和吸收率其中之一很大或者很小)时,该方法仍然能够进行测量,并且透射率和反射率测量可苇复性好,相对偏差一般不超过6%。
With the development of optoelectronic technology, a variety of optical translucent films have been widely used in practice. The use of optical films must be based on the known optical properties such as transmittance, reflectance and absorptivity. In general, the transmittance of semi-permeable thin film measurement is relatively simple, but for the reflection and absorption rate measurement is often more complicated. In this paper, based on the previous experience of measurement of optical properties of thin films, a method of effectively measuring the optical properties of semi-transparent films by using a radiometer is proposed by analyzing the transmission of optical paths between multilayer films. The method is simple, rapid, The hemispherical optical properties of the film in the measurement band can be directly obtained. The method is still capable of making measurements when the optical characteristics of the film to be measured are extreme (one of the transmissivities, reflectivities and absorptivities are large or small), and the transmissivity and reflectivity measurements are reproducible, relative deviations Generally not more than 6%.