论文部分内容阅读
与时延测试相比，时延故障诊断需要更精确的故障模型．该文提出了采用精确测量的时延模型和时延故障模型．在这种模型下，利用电路通路图的原理，得到与被测电路的拓扑结构有关的一个精简测试集．测试集的大小与电路的大小保持线性增长关系；其中的每一个测试对应于一条通路的单跳变敏化［９］ 向量．将测试集中的单跳变敏化向量送入被测电路，可以用测试仪测量相应通路的延时，得到电路关于此测试集的时延故障症侯．该文对时延故障症侯提供的诊断方法是针对单线时延故障的，可以将时延故障定位到少数的几根线上，甚至单线上．实验结果表明，这种时延测试的诊断方法是行之有效的．
Compared with the delay test, the delay fault diagnosis needs a more accurate fault model. This paper presents a time-delay model and a delay fault model using accurate measurements. In this model, the principle of the circuit diagram is used to obtain a reduced test set related to the topology of the circuit under test. The size of the test set maintains a linear growth relationship with the size of the circuit; each of these tests corresponds to a single-hop sensitization [9] vector for one path. Will test the concentration of single-hop sensitization vector into the circuit under test, you can use the tester to measure the delay of the corresponding path, get the circuit delay test of this test set Hou Hou Hou. This article provides a diagnostic method for delay fault Hou is for single-line delay fault, you can locate the delay to a few of the few lines, or even a single line. The experimental results show that this method of delay testing diagnosis is effective.