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扫描隧道显微镜（ＳＴＭ）和原子力显微镜（ＡＦＭ）由于具有原子量级的分辨率，所以在表面物理、化学、生物等领域得到了越来越广泛的应用．但是，扫描隧道显微镜只能观察导电样品，这就限制了它的应用范围．原子力显微镜尽管能观察导电和非导电样品，然而一般需要另外一套设备．文中介绍了一个自制的新系统，它既可用作ＳＴＭ，同时又可作为ＡＦＭ．实验表明，该系统已经达到ｎｍ量级的分辨率，还有可能进一步提高到原子量级的分辨率．
Scanning tunneling microscope (STM) and atomic force microscope (AFM) are widely used in the field of surface physics, chemistry and biology due to the resolution of the order of magnitude. However, scanning tunneling microscope can only observe the conductive samples, which limits its scope of application. Atomic Force Microscopy Although it is possible to observe both conductive and non-conductive samples, another set of equipment is generally required. This article describes a new home-made system that can be used both as an STM and as an AFM. Experiments show that the system has reached the resolution of nm order, and it is possible to further improve the resolution of the order of magnitude.