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The concept of Space Charge Capacitance (SCC) is proposed and used to make a novel analytical charge model of quantized inversion layer in MOS structures. Based on SCC, continuous expressions of surface potential and inversion layer carrier density are derived. Quantum mechanical effects on both inversion layer carrier density and surface potential are extensively included. The accuracy of the model is verified by the numerical solution to Schrodinger and Poisson equation and the model is demonstrated,too.
The concept of Space Charge Capacitance (SCC) is proposed and used to make a novel analytical charge model of quantized inversion layer in MOS structures. Based on SCC, continuous expressions of surface potential and inversion layer carrier density are derived. Quantum mechanical effects on both Inversion layer carrier density and surface potential are widely included. The accuracy of the model is verified by the numerical solution to Schrodinger and Poisson equation and the model is demonstrated, too.