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用撇取氧化膜的方法配合XPS和X射线衍射研究了P、As,Ga,Ge,In,Al,Mg,Zn,Cu,Ag,Cd,Tl,Pb,Sb,Bi等15个微量元素(浓度0.005at.-％)在液态Sn表面膜和体相中的分布。其中Ga,P,Ge,Mg,Zn,Al,In,As在表面膜中有很大的富集。富集的程度与微量元素氧化物的生成热有关。XPS研究结果表明,只有Ga,Ge,As,Al,Zn在最表层2—3nm内富集。富集的结果改变了氧化膜的组成和结构。微量元素以氧化物的形式同SnO组成复杂的含氧酸盐而构成氧化膜,并因此使氧化膜变得更稳定和致密,起了保护液态Sn免于氧化的作用。
In this paper, 15 microelements of P, As, Ga, Ge, In, Al, Mg, Zn, Cu, Ag, Cd, Tl, Pb, Sb and Bi were studied by skimming oxide film with XPS and X-ray diffraction Concentration 0.005at .-%) distribution in the liquid Sn surface film and bulk phase. Among them, Ga, P, Ge, Mg, Zn, Al, In and As are greatly enriched in the surface film. The degree of enrichment is related to the formation of trace element oxides. XPS results show that only Ga, Ge, As, Al and Zn are enriched in the outermost 2-3 nm. The result of the enrichment changes the composition and structure of the oxide film. Trace elements in the form of oxides with the composition of complex oxo acid with SnO constitute an oxide film, and thus the oxide film becomes more stable and dense, played a role in protecting liquid Sn from oxidation.