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本文通过对运算放大器共模输入特性的分析,推导出运算放大器电参数共模抑制比的定义测试法,即失调电压法测K_(CMR)。本文将该方法与IEC(国际电工委员会)规定的两种测试方法进行了比较,运用误差分析的理论,分析了三种方法的误差,证明了失调电压法测K_(CMR)是对国际上现存两种方法的改进。(一般原理见《电子科学技术》杂志83年第6,10期)
In this paper, through the analysis of the common mode input characteristics of op amp, the definition test method of op amp common mode rejection ratio is deduced, that is, the offset voltage method is used to measure K_ (CMR). This paper compares the method with the two test methods stipulated by the IEC (International Electrotechnical Commission). By using the theory of error analysis, the errors of the three methods are analyzed. It is proved that the KCMR (Offset Voltage Method) Two methods of improvement. (See the general principle of “Electronic Science and Technology” magazine 83rd 6,10)