一九九七年五月六日至九日,在上海国际展览中心举行的上海国际电子生产设备工业展览会上,惠普公司电路板测试系统及其几项新技术与观众见面。这其中既有为国际电子业普遍采用且为中国工业界同仁所熟悉的HP3070系列电路板测试系统,还有在其上发展的“快克”、“故障侦探”、“功能测试接 From May 6 to 9, 1997, at the Shanghai International Electronics Manufacturing Equipment Industry Exhibition held in Shanghai International Exhibition Center, the Hewlett-Packard Company circuit board testing system and several new technologies met with the audience. Among them, the HP3070 series of circuit board test systems commonly used by the international electronics industry and familiar to the Chinese industry colleagues, as well as the development in the “crack”, “Fault Detective”, "Functional Test