一、导言在碳素材料的结构研究和生产控制中,越来越经常地应用X射线衍射技术来测定其晶格常数和晶粒大小,从而计算出它的石墨化度。许多学者对石墨化度如何衡量做了大量的研究,得出了殊途同归或不同的结论,散见于各有关文献。他们的结论往往表现在他们提出的石墨化衡量方法和计算公式上。一个方面是用(hKL)和(hKO)面的衍射强度的比值,来评价石墨化程度。最初见于 I. INTRODUCTION In the structural research and production control of carbon materials, the degree of graphitization is calculated by the X-ray diffraction technique to determine its lattice constant and grain size more and more frequently. Many scholars have done a great deal of research on how to measure the degree of graphitization, and have come to the conclusion that different routes are the same or different, which are scattered in various related literatures. Their conclusions often appear in the graphitization methods and formulas they propose. One aspect is to evaluate the degree of graphitization by the ratio of the diffraction intensities of (hKL) and (hKO) planes. First seen