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采用正电子湮没方法研究了充分退火与塑性变形多晶纯镍中阴极充氢产生的微观缺陷及其回复行为。实验结果表明，空位的迁移激活能Em＝0.96±0.05eV、电解充氢后充分退火和塑性变形纯镍的线性参数S和平均寿命均有显著上升。氢致缺陷的种类与充氢前样品的状态有关，充分退火态试样除产生一定数量的空位和位错外，还产生了相当数量在923K以上仍不能回复的微空洞甚至微裂纹等大尺寸缺陷，而形变试样充氢后主要是位错和空位以及空位团。未发现微空洞等亚微观缺陷的存在。
The positron annihilation method was used to study the microscopic defects and recovery behaviors of cathodal hydrogen charging in fully annealed and plastically deformed polycrystalline pure nickel. The experimental results show that the vacancy migration activation energy Em = 0.96 ± 0.05eV, the linear parameter S and the average life expectancy of fully annealed and plastically deformed pure nickel after electrolytic hydrogen charging are significantly increased. The type of hydrogen induced defects is related to the state of the sample before hydrogenation. In addition to a certain number of vacancies and dislocations, fully annealed samples also produced a large number of large cavities or even microcracks which can not be recovered above 923K Defects, while the deformation of the sample after filling the main dislocations and vacancies and vacancies. No submicroscopic defects such as micro-cavities were found.