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就胶片—试件距离 (FTD)对散射线的影响作了理论研讨 ,得知当 FTD≥4 f( f:缺陷直经 )时 ,缺陷深度和直径对散射线的影响可忽略不计 ,此时射线照相对比度△ D只取决于缺陷高度 h,由此找到缺陷测高新方法的理论支柱。对理论推出的结果通过实验得到有效验证。
The effect of the film-specimen distance (FTD) on the scattering line is discussed theoretically. It is found that the influence of the depth and the diameter of the defect on the scattering line is negligible when the FTD is greater than or equal to 4 f Radiographic contrast ΔD depends only on the defect height h, thus finding a theoretical basis for the new method of defect height measurement. The result of the theory is validated experimentally.