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随着光盘存储数据密度的增加,空白基片厚度的容许误差容限越来越小。全新设计的ETA-ISS在线基片厚度传 感器,可精密测试基片厚度,检测注塑工艺质量,有利于早期发现工艺恶化,于第一时间调整工艺。 多光谱的测试原理确保高精密的测试,可以消除翘曲干扰,增强系统稳定性,避免工业环境产生的各种影响。 通过一个内置的网络接口传输数据,单一基片的厚度分布,以及连续基片的厚度变化趋势可以被监视或存储在ETA 在线扫描仪中,也可存储在任意Windows操作环境下的PC中。
With the increase of the data storage density of the optical disc, the allowable error tolerance of the blank substrate thickness is getting smaller and smaller. The new design of the ETA-ISS online substrate thickness sensor, the substrate thickness can be precision test to detect the quality of injection molding process is conducive to early detection of process deterioration, the first time to adjust the process. The multi-spectral test principle ensures high-precision testing that eliminates warpage and enhances system stability without the effects of any industrial environment. Data transfer through a built-in network interface, the thickness profile of a single substrate and the thickness variation of a continuous substrate can be monitored or stored in an ETA on-line scanner or in a PC on any Windows operating environment.