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基于单分子定位的荧光纳米分辨显微成像中,系统漂移会使得单分子定位出现额外偏差,从而使重构图像的分辨率降低,造成图像模糊.因此,对系统漂移量的控制至关重要.近年来,防漂移的方法层出不穷.本文针对其中一种利用光学测量原理和引入负反馈的防漂移方法做了系统的研究,分析了其原理和实现过程,对整个系统进行了误差分析,通过实验标定了整个防漂移系统的精度.该系统可以主动实时地校正漂移量,实现了显微镜轴向9.93 nm的防漂移精度.与现有商用的显微镜自带的防漂移装置相比,防漂移精度提高了一个量级.
In fluorescence nano-resolution microscopy based on single-molecule localization, the drift of the system will cause additional deviation of the single molecule localization, so that the resolution of the reconstructed image will be reduced and the image will be blurred. Therefore, it is very important to control the system drift. In recent years, anti-drift methods emerge in an endless stream.In this paper, one of the use of optical measurement principle and the introduction of anti-drift anti-drift method to do a systematic study, analysis of the principle and implementation process, the error analysis of the entire system, through the experiment Which calibrates the accuracy of the entire anti-drift system.The system can proactively correct the amount of drift in real time, to achieve anti-drift precision of 9.93 nm in the microscope axis.Compared with the anti-drift device of the existing commercial microscope, anti-drift accuracy is improved A magnitude.