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用真空蒸镀法在ＫＢｒ晶体上制备半连续Ａｇ膜，膜的复盖率由０．３至０．８．由电镜观察膜的形貌随复盖率ｐ的变化：当ｐ很小或很大时为均匀膜；当ｐ接近临界阈值ｐｃ时为不均匀膜．测定了膜的形貌参数随ｐ的变化．及试样在２．５～１２．５μｍ波段的透射光谱．当ｐ＜ｐｃ时，透射率随波长增加而增大；当ｐ＞ｐｃ时，透射率则随波长增加而下降．当ｐｐｃ时，透射率与波长无关，即出现光学逾渗效应．最后，讨论了沉积与凝聚对膜几何参数的影响
A semi-continuous Ag film was prepared on KBr crystals by vacuum evaporation method. The coverage of the films was from 0.3 to 0.8. Observed by electron microscopy morphology of the membrane with the coverage rate p changes: when p is small or very large uniform film; when p close to the critical threshold pc when the uneven film. The morphological parameters of the films were determined with the change of p. And the transmission spectrum of the sample in the band of 2.5 ~ 12.5μm. When p pc, the transmittance decreases with increasing wavelength. When p p pc, the transmittance has nothing to do with the wavelength, that is, the optical percolation effect. Finally, the influence of deposition and agglomeration on the geometrical parameters of the film is discussed