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本研究搭建了六级半导体制冷器工作特性测试实验台。实验研究了不同输入电压、热端温度和外部散热情况等工况下六级半导体制冷器冷端温度的变化规律。结果表明:制冷器初始阶段的温降速率随输入电压的增大而增大,同一输入电压下的温降速率随着时间的推移逐渐减小;相比二级半导体制冷器,两者温降速率基本相同;所研究六级半导体的最佳输入电压为20 V~30 V;制冷器冷端温度随热端温度的上升而升高;外部环境绝热有利于降低冷端温度。
This study set up a six-level semiconductor refrigerator operating characteristics test bench. Experimental study of different input voltage, hot end temperature and external cooling conditions such as six-stage semiconductor cooler cold junction temperature changes. The results show that the rate of temperature drop in the initial stage of the refrigerator increases with input voltage and the temperature drop rate decreases with the passage of time under the same input voltage. Compared with the secondary semiconductor refrigerator, the temperature drop The best input voltage of the six-stage semiconductor is 20 V ~ 30 V; the temperature of the cold junction of the cooler increases with the rise of the hot-end temperature; the external environment adiabatic helps to reduce the temperature of the cold junction.