概述元件上的污染材料对电子管与半导体器件有很大的影响。已经研究、出版和运用了许多清洗这些元件的方法。然而,实际上,还没有检验金属表面上无机物污染(或是由于清洗过程所造成的初始污染或残余污染)的方法。本文是一篇关于检验金属表面上无机物污染的 Overview Pollutants on components have a large impact on tubes and semiconductor devices. Many methods of cleaning these components have been researched, published and utilized. In practice, however, there has been no method of testing for inorganic contamination of the metal surface (either due to initial contamination or residual contamination caused by the cleaning process). This article is an article about testing of inorganic contaminants on metal surfaces