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本文介绍一种X射线荧光测厚仪,用以测量钢基及钨基上的碳化钛或氮化钛涂层厚度。仪器测量范围为0.1—20μm,测量孔径为4mm。
This article describes an X-ray fluorescence thickness gauge used to measure the thickness of titanium carbide or titanium nitride coatings on steel and tungsten substrates. Instrument measuring range of 0.1-20μm, measuring aperture of 4mm.