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本文从晶体旋转法测定液晶分子预倾角的ｏ光和ｅ光的位相差表达式出发，详细分析晶体旋转法液晶预倾角测试仪对液晶层厚的适用范围，并指出对于厚度为５～９μｍ液晶层预倾角的测量应采用波长约为４００ｎｍ的光源。
In this paper, starting from the phase difference between the pre-tilt and post-tilt angles of the liquid crystal molecules measured by the crystal rotation method, a detailed analysis of the range of application of the liquid crystal pretilt tester to the thickness of the liquid crystal layer is given. Layer pre-tilt measurement should be used with a wavelength of about 400nm light source.