半导体是组成电子装置的重要元件。对于机械零件,其故障的发生是通过初期故障——偶发故障——磨耗故障这样一个过程。而半导体在额定范围内使用时,一般认为初期故障以后,偶发故障是半永久性的,电子装置的故障是“某日、突然发生”的。但从我们十年来的经验,认为半导体似乎也存在着寿命问题。现在,我们厂只是对特定的电容进行计划更换,至于其他电子器件采取有问题再处理的办法。这种对故障的发生和处理的办法并没有什么进步,因此进行了“加速寿命试验”,以图从特性参数的变化来推算其寿命。 Semiconductors are an important component of electronic devices. For mechanical parts, the failure occurs through the initial failure - incidental failure - abrasion such a process. The use of semiconductors in the rated range is generally believed that after the initial failure, accidental failure is semi-permanent, electronic device failure is “a certain day, suddenly happen.” But from our experience over the past decade, there seems to be a question of life expectancy in semiconductors. Now, our factory just plans to replace the specific capacitor, as the other electronic devices to take the problem again approach. This kind of failure occurred and dealt with no improvement, so the “accelerated life test” in order to figure out the change from the characteristic parameters to estimate its life.