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采用~(60)Co γ射线辐照对集成电路进行改性研究,通过试验,结果表明,集成电路经过辐照可以达到改善参数,提高元件的合格率。与美国Rikitts研究相吻合。
Through the experiment, the results show that the irradiation of the integrated circuit can improve the parameters and improve the qualified rate of the components. In line with the U.S. Rikitts study.