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为了解决线性集成电路直流和低频参数测试方面存在的问题,沈阳仪器仪表工艺研究所第四研究室,开展了线性集成电路测试方法的研究工作,并研制成功了SI-1型线性集成电路综合参数测试仪。80年7月26日至28日在沈阳召开了上述测试方法和测试仪器的鉴定会,会议由沈阳仪器仪表工艺研究所主持,国家仪器仪表总局和有关工厂、院校、科研、共11个单位,15名代表参加了会议。
In order to solve the problems existing in DC and LF testing of linear integrated circuits, Shenyang Institute of Instrumentation and Technology, Fourth Research Laboratory, conducted a research work on the test methods of linear integrated circuits and developed the integrated parameters of SI-1 linear integrated circuits Tester. July 26, 80 to 80 in Shenyang held the above-mentioned test methods and test equipment identification meeting, the meeting was held by the Shenyang Institute of Instrumentation Technology, the State Administration of Instrument and related factories, universities, research, a total of 11 units , 15 delegates attended the meeting.