在一个ASICs可测试性新时代中,边界扫描结构已经成为一种可实现的技术。尽管起初它的开发是为了便于表面安装器件的电路板互连测试,但头脑灵活的测试设计师们很快意识到在实现复杂的制造测试和系统内诊断时一个标准接口的好处。 现在完全可以这样讲:那些将边界扫描加入到A-SICs设计中主要是为了对芯片本身进行测试的公司决不会比那些仅仅为了测试板际互连的公司少。越来越多的公司意识到,与所得的最终利益相比,有关边 In a new era of ASICs testability, boundary-scan architecture has become a viable technology. Although initially developed to facilitate surface-mount device circuit board interconnect testing, mind-boggling test designers quickly realized the benefits of a standard interface for complex manufacturing and in-system diagnostics. Now it’s perfectly safe to say that companies that add boundary-scan to A-SICs designs primarily to test the chips themselves will by no means have fewer companies than those that merely test the interconnects. More and more companies are aware of the relevant side as compared to the ultimate benefit received