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IDDQ测试方法最适合CMOS电路桥接故障的测试 ,给出CMOS电路IDDQ测试的几个基本概念 ,探讨了桥接故障IDDQ可测性条件 ,从理论上证明了静态CMOS电路线结点桥接故障的IDDQ可测性 .
The IDDQ test method is most suitable for the test of CMOS circuit bridging faults. Some basic concepts of IDDQ testing for CMOS circuits are given. The test conditions of IDDQ bridging faults are discussed. IDDQ test is proved theoretically. Testability.