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本文以 X 射线衍射仪粉末法的慢速双向连续扫描法和三点抛物线拟合法两种方法分别测定硅(多晶粉末样品)点阵参数。各测三次得25℃时之 a 值分别为 a=5.43086±0.00016与 a=5431054±0.000019,其精确度分别为万分之一与五万分之一,并分析了衍射仪粉末法测定点阵参数的各种误差来源及消除方法,所得结果与有关资料的数据很接近,其中三点抛物线拟合法的精确度比慢速双向连续扫描法高。
In this paper, the lattice parameters of silicon (polycrystalline powder samples) were determined by slow two-way continuous scanning X-ray diffraction powder method and three-point parabola fitting method. The measured values of a at 25 ℃ were a = 5.43086 ± 0.00016 and a = 5431054 ± 0.000019, respectively, with the accuracy of 1/10000 and 1/10000, respectively. The diffraction pattern of the lattice The source of the various errors in the parameters and the elimination method, the results obtained and the data is very close to the data, of which three-point parabolic fitting accuracy than the slow two-way continuous scanning method.