论文部分内容阅读
一个器件可靠性的定义是:在设计规定条件下,在规定的时间内,完成其功能的概率。如今对集成电路的可靠性水平要求高,使得在使用应力条件下测定器件的可靠性,花费时间长且费用高,因而实际上难以实现。 能够解决这些矛盾关系的实用方法是采用加速寿命试验,也就是让器件所工作的应力水平,比它们在典型应用中正常经历到的高。 寿命试验一般是在提高温度和最大推荐的工作电压下进行的,目的是加速那些涉及到温度和电应力条件的,与时间有关的失效机理,寿命试验是预测器实际现场应用失效率的主要方法。
The reliability of a device is defined as the probability of completing its function within the specified time under the specified design conditions. Today, the high level of reliability of integrated circuits, making the use of stress conditions to determine the reliability of the device, take a long time and high cost, it is actually difficult to achieve. A pragmatic approach to solving these paradoxes is to use accelerated life testing, which means that the stress levels at which the device will operate are much higher than those normally experienced in typical applications. Life tests are generally carried out at elevated temperatures and at the maximum recommended operating voltage in order to speed up time-dependent failure mechanisms that involve temperature and electrical stress conditions. Life tests are the primary method of predicting actual field failure rates .