前言为研究金属离子提供的电子陷阱对卤化银微粒电子过程的影响,进行了下列实验: 在涂布前往卤化银乳剂中加入少量金属离子(Hg~(2+)、Cu~(2+)、Pb~(2+)、Ni~(2+)、Co~(2+)、Cd~(2+)、Fe~(2+)、Zn~(2+)、Ba~(2+)、Sr~(2+)、Mn~(2+)),测定所引起的照相性能变化,观察在液氮温度下含有不同金属离子的卤化银乳剂发射强度的变化。所加入的金属离子量很少不足以影响卤化银微粒的结晶状态大小及离子化过 Introduction To investigate the effect of electron traps provided by metal ions on the electronic processes of silver halide particles, the following experiments were performed: Add a small amount of metal ions (Hg2 +, Cu2 + Pb 2+, Ni 2+, Co 2+, Cd 2+, Fe 2+, Zn 2+, Ba 2+, Sr ~ (2 +), Mn ~ (2+)), the change of photographic properties was measured, and the change of emission intensity of silver halide emulsions containing different metal ions at liquid nitrogen temperature was observed. The amount of metal ions added is rarely enough to affect the crystalline state of the silver halide grains and ionized