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离子推进器的寿命直接影响航天器的使用年限,推进器加速栅极腐蚀是影响其寿命的主要因素。为了了解离子推进器加速栅极孔壁腐蚀机理,利用基于浸入式有限元与粒子模拟(IFE-PIC)结合法和Monte Carlo碰撞(MCC)方法的三维数值模拟程序,对离子运动、电荷交换(CEX)碰撞以及加速栅极腐蚀进行了模拟。研究结果表明,加速栅极电压的变化对加速栅极孔壁的腐蚀深度影响很小,屏栅极电压的变化会对加速栅极上游区域的CEX离子能量产生变化,影响加速栅极孔壁腐蚀;轰击加速栅极孔壁的CEX离子源自加速栅极上游、加速栅极孔内和加速栅极下游3个区域,并且源自加速栅极上游区域离子能量比源自加速栅极下游区域和加速栅极孔内离子能量大的多,加速栅极孔壁腐蚀主要由源自加速栅极上游的CEX离子对加速栅极孔壁撞击造成。
The life of the ion thruster directly affects the useful life of spacecraft, thrusters accelerate the corrosion of the grid is the main factor affecting their life. In order to understand the mechanism of ion propeller accelerating gate hole wall erosion, ion motion, charge exchange (IFE-PIC) and three-dimensional Monte Carlo collision (MCC) CEX) collisions and accelerated gate corrosion were simulated. The results show that accelerating the gate voltage has little effect on accelerating the corrosion rate of the gate hole wall. The change of the gate voltage will change the CEX ion energy in the upstream region of the accelerating gate, which will affect the corrosion of the gate wall ; CEX ions bombarding the walls of the accelerating gate electrode originate from the accelerating gate upstream, accelerating within the gate aperture and downstream of the accelerating gate three regions, and the ion energy originating from the accelerating gate upstream region is lower than that from the accelerating gate downstream region and Accelerate the gate hole ion energy is much larger, accelerate the corrosion of the gate wall hole mainly from the accelerating gate upstream of the CEX ion to accelerate the gate hole wall caused by the impact.