大口径横向双剪切激光干涉仪

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空间激光通信中发射波面质量接近衍射极限, 测量波面是调整和检验发射系统的依据。传统的平板剪切干涉仪是测量波面的有效手段之一, 但应用在测量波面高度小于0.3个波长, 口径100~300 mm, 短相干长度的半导体激光器时存在一些限制。大口径横向双剪切激光干涉仪改进于马赫曾德尔结构, 可以实现这一功能。干涉仪主要由两块透射反射镜和四块反射镜组成, 其中一块反射镜结构上下分开, 形成一定的夹角, 通过干涉图上下条纹的差分求出波像差, 提高灵敏度。目前建成的仪器有效通光口径为290 mm, 等光程相干涉, 可适用于相干长度短的光源。仪器对可调谐激光器发射波面进行了测量, 通过计算机处理得到波面, 波面高度的峰谷值为1.0个波长。
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