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目前采用的各种非破坏法镀层测厚仪,对于一些特殊的镀层(如光亮镀层、多层镀层等)、微电子学中的镀层以及小尺寸复杂零件的镀层等厚度测量还不能完全满足要求。为了控制上述各种镀层的厚度,比较适宜的是采用库仑法来测量镀层厚度。这种方法的优点是具有通用性,也就是说测量结果同镀层——基体材料的组合形式无关;此外,它还有高的测量精度和可靠性。
The current non-destructive coating thickness gauge, for some special coating (such as bright coating, multi-layer coating, etc.), microelectronics coating and small size complex parts coating thickness measurement can not fully meet the requirements . In order to control the thickness of the various coatings described above, it is advisable to use coulometry to measure the thickness of the coating. The advantage of this method is its versatility, that is to say that the measurement is independent of the combination of the coating and the matrix material. In addition, it offers high measurement accuracy and reliability.