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This paper demonstrates the application of step-scan phase modulation Fourier transform infrared photoacoustic spectroscopy(FTIR-PAS) in non-destructively depth profiling of styrene-butadiene-styrene block copolymer/polyethylene terephthalate(SBS/PET) layered materials.The surface thicknesses of three layered samples were determined to be 1.2,4.3 and 9.4μm by using phase difference analysis,overcoming the spatial detection limits of FTIR.Combined with generalized two-dimensional(G2D) FTIR correlation analysis,the spatial origins of peaks in the SBS/PET spectrum are identified with those having overlapping peaks between different layers are resolved.
This paper demonstrates the application of step-scan phase modulation Fourier transform infrared photoacoustic spectroscopy (FTIR-PAS) in non-destructively depth profiling of styrene-butadiene-styrene block copolymer / polyethylene terephthalate (SBS / PET) layered materials. Three layered samples were determined to be 1.2, 4.3 and 9.4 μm by using phase difference analysis, overcoming the spatial detection limits of FTIR. Combined with generalized two-dimensional (G2D) FTIR correlation analysis, the spatial origins of peaks in the SBS / PET spectrum are identified with those having overlapping peaks between different layers are resolved.