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在许多地球化学研究中 Cr、V 和 Ba 等元素是十分重要的,对它们的测定浓度需要降至几 p.p.m。有几种技术能够达到这一目标,其中包括波长色散 X-射线荧光(WD-XRF)测定。然而这些方法在分析方面不是没有困难的,特别是常用的波长色散 X-射线光谱仪,虽然具有高的额定分辨率,但几种不同光谱的重叠干扰仍影响这些感兴趣元素,例如:V K_α线上的 TiK_β,CrK_α线上的 VK_β,以及 BaL_α线上的 TiK_α等。实际上后者的干扰在硅酸岩分析应用中是相当严重的,因而有些工作者提出用不太强烈的 BaL_β线进行分析。
In many geochemical studies Cr, V and Ba and other elements are very important for their measured concentrations need to be reduced to a few p.p.m. There are several technologies that can achieve this goal, including wavelength-dispersive X-ray fluorescence (WD-XRF) assays. However, these methods are not without difficulties in analysis, especially the commonly used wavelength dispersive X-ray spectrometers, which have high rated resolution but overlap interference of several different spectra still affects these elements of interest, for example: V K_α line On the TiK_β, CrK_α line VK_β, and BaL_α line TiK_α and so on. In fact, the latter interference is quite serious in silicate analysis applications, and some workers have proposed to use the less intense BaL_β line for analysis.