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在图10中,与E分量有关的量子效率和平均内部强度Φ_(in)是利用MTL模型在同样的p、t_a和t_g(但侧面角为48°)条件下计算出来的,波纹上覆盖着介质层和金属层,它们的t_d为0.4μm。MTL方法表明在相同的位置有同样的吸收峰。
In Figure 10, the quantum efficiency and average internal strength Φ_ (in) associated with the E component is calculated using the MTL model for the same p, t_a and t_g (but with a flank angle of 48 °) The dielectric and metal layers have a t_d of 0.4 μm. The MTL method shows the same absorption peak at the same position.