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利用扫描力显微术中压电响应模式原位研究了 (111)择优取向的PZT6 0 4 0铁电薄膜的纳米尺度畴结构及其极化反转行为 .铁电畴图像复杂的畴衬度与晶粒中的畴排列和晶粒的取向密切相关 .直接观察到极化反转期间所形成的小至 30nm宽的台阶结构 ,该台阶结构揭示了 (111)取向的PZT6 0 4 0铁电薄膜在极化反转期间其畴成核与生长机理主要表现为铁电畴的纵向生长机理 .
The nanoscale domain structure and polarization reversal behavior of (111) preferentially oriented PZT6 0 4 0 ferroelectric thin films were investigated in situ using the piezoelectric response model of scanning force microscopy. The complex domain contrast Is closely related to the alignment of the domains in the grains and the orientation of the grains.It is directly observed that as small as 30 nm wide step structures formed during the inversion of polarization, this step structure reveals the (111) -oriented PZT6040 ferroelectric The mechanism of domain nucleation and growth during the reversal of the polarization of the film mainly shows the longitudinal growth mechanism of the ferroelectric domains.