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利用总积分散射仪对不同条件下制备的金属银膜、Y2O3稳定ZrO2(YSZ)薄膜、TiO2薄膜和1064 nm与532 nm双波长增透膜的表面均方根(RMS)粗糙度和散射特性的变化规律进行了系统研究,并与样品的制备条件、生长过程、材料组成及光学特性等各方面相结合,对测量结果做出了合理解释,从而使总积分散射测量在其他领域的研究得以扩展和应用.
The total area scattering (RLC) was used to measure the root mean square (RMS) roughness and scattering properties of metallic silver films, Y2O3 stabilized ZrO2 (YSZ) films, TiO2 films and 1064 nm and 532 nm dual wavelength AR coatings prepared under different conditions The rules of variation are systematically studied and the measurement results are reasonably explained in the aspects of preparation conditions, growth process, material composition and optical properties of the samples, so that the research on total-integral scattering measurement in other fields can be expanded And application.