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基于半导体激光器远场分布新模型和反源计算方法，建立了一套半导体激光器近场分布测量装置。系统的测量机制是利用测量的远场数据，反源计算近场分布。该装置由计算机控制，自动完成远场数据采样及拟合处理，经反源计算得到近场分布。
Based on the new model of far-field distribution of semiconductor laser and the calculation method of inverse source, a set of near-field distribution measuring device for semiconductor laser was established. The measurement mechanism of the system is to use the measured far-field data to calculate the near-field distribution from the source. The device is controlled by a computer and automatically performs far-field data sampling and fitting processing. The near-field distribution is obtained by calculating the anti-source.