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The piezoresistive effect of the pristine carbon nanotube (CNT) films has been studied. Carbon nanotubes were synthesized by hot filament chemical vapor deposition. The piezoresistive effect in the pristine CNT films was stud-ied by a three-point bending test. The gauge factor for the pristine CNT films under 500 microstrains was found to be at least 65 at room temperature, and increased with tem-perature, exceeding that of polycrystalline silicon (30) at 35℃. The origin of the piezoresistivity in CNT films may be ascribed to a pressure-induced change in the band gap and the defects.
The piezoresistive effect of the pristine CNT films was stud-ied by a three-point bending test. The gauge factor for the pristine CNT films under 500 microstrains was found to be at least 65 at room temperature, and increased with tem-perature, exceeding that of polycrystalline silicon (30) at 35 ° C. The origin of the piezoresistivity in CNT films may be ascribed to a pressure-induced change in the band gap and the defects.