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在被要求密封的电子产品(器件或组件)中气密性不良是造成产品失效的重要原因之一。在传统的检漏方法中,对低密封产品(如体积较大的组件及小整机)往往采用油质检漏,但此类方法也存在一些弊端。介绍了一种低气压去离子水检漏方法,阐述了其试验原理、理论依据以及采用本方法进行的实际检漏过程,探讨了在检漏过程中易造成误判、漏判的几点注意事项,最后对试验结果进行了验证,认为在漏率不大于10 Pa.cm3/s的情况下,该方法是行之有效的检漏方法之一,与传统的油质检漏方法相比,有其不可替代的优越性。
Poor air tightness in electronics (devices or assemblies) that are subject to sealing is one of the major causes of product failure. In traditional leak detection methods, oil leak detection is often applied to low-seal products (such as bulky components and small devices), but such methods also have some drawbacks. Introduced a low pressure deionized water leak detection method, described its test principle, theoretical basis and the actual leak detection process, discussed in the leak detection process can easily lead to miscarriage of justice, leakage of a few notices Finally, the test results were verified, and it is considered that the leak detection rate is not more than 10 Pa.cm3 / s, this method is one of the effective leak detection methods. Compared with the traditional oil leakage detection method, Has its irreplaceable superiority.