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用 X—射线衍射法测定微量样品中相的含量,在化工产品的研制、生产过程中起着十分重要的作用。F.H.Chung 曾在 1974年提出了基体冲洗法——K 值法的 X—射线衍射定量相分析方法。其基本公式为
The determination of the content of trace phase in the sample by X-ray diffraction plays a very important role in the development and production of chemical products. F.H.Chung proposed in 1974 the substrate washing method - K value of the X-ray diffraction quantitative phase analysis method. The basic formula is