建立“Smile”效应条件下半导体激光阵列近、远场模型,将光纤近场扫描法与高斯光束传输理论相结合,从理论和实验上证明了“Smile”效应值的大小与分布形态共同决定半导体激光器阵列快轴方向实际输出光束质量,获得了不同“Smile”效应条件下半导体激光阵列快轴方向光束参数积Kf值。 The “near” and “far” models of semiconductor laser arrays with “Smile” effect are established. The combination of fiber near field scanning and Gaussian beam transmission theory is used to prove the size and distribution of the “Smile” effect value theoretically and experimentally Shape together determine the actual output beam quality in the direction of the fast axis of the semiconductor laser array and get the Kf value of the beam parameter in the direction of the fast axis of the semiconductor laser array with different “Smile” effects.