我院S4-10型扫描电子显微镜是1973年从国外进口仪器。二次电子探头备品已消耗殆尽,影响其正常工作的开展。向国外订购,非常困难,且价格昂贵。为使仪器能正常运转,满足各专题及检验工作的急需,我们自己动手试制。经过摸索和试验,取得了较为满意的成果,基本上满足了仪器工作的需要。探头是二次电子探测器的重要部件,它把样品表面产生的二次电子转换成光子。光子穿过光导管进入光电倍增管后,又转换成电的信号,再经放大系统和处理系统,最后到阴极射线管的栅极,用来调节阴极射线管的亮度。因为阴极射线管的电子束和镜筒的 S4-10 Scanning Electron Microscope in our hospital was imported from abroad in 1973. Secondary electronic probe spare parts have been depleted, affecting its normal work. Ordering abroad is very difficult and expensive. In order for the instrument to operate normally and meet the urgent needs of various topics and inspection work, we try it on our own. After groping and testing, and achieved more satisfactory results, basically meet the needs of the instrument work. The probe is an important part of a secondary electron detector that converts secondary electrons generated on the sample surface into photons. Photons through the light pipe into the photomultiplier tube, and then converted into electrical signals, and then by the amplification system and processing system, and finally to the cathode ray tube grid, used to adjust the brightness of the cathode ray tube. Because the cathode ray tube electron beam and the tube