本文提出一种微处理器测试程序的编制方法——T分类法,并运用这种方法编制了8080微处理器测试程序,并将部份程序进行了测试.与指令功能分类法相比,应用此法可以节省图案存贮器容量78.5％,适用范围广,有利于故障分析. 本文还介绍了利用建立标准图案单元库的方法在MDR-Z80微型机上实现的半自动图案生成.并探索了全自动图案生成的可能性. This paper presents a preparation method of microprocessor test program - T classification, and use this method 8080 microprocessor test program was compiled, and some programs were tested. Compared with the instruction function classification, the application of this The method can save 78.5% of the pattern memory capacity and is suitable for a wide range of applications, which is good for fault analysis.This paper also introduces the semi-automatic pattern generation on the MDR-Z80 microcomputer by using the standard pattern cell library, and explores the automatic pattern Generative possibilities.