This paper analyses three causes of offset error in roundness measurement and presents corresponding compensation methods.The causes of offset error include exc
Ml0.7Mm0.3Ni3.7Co0.7Mn0.4Al0.2 nanocrystalline hydrogen storage materials are prepared by melt-spinning(MS).X-ray diffraction is used for the measurement of the
Fluorescence properties of Eu^3+:Y2SiO5 have been investigated.Transitions between ^5D and ^7Fwere were studied with transmission spectra,fluorescence spectra,p
The effects of parasitic capacitance in induction motor system are unnoticed when it is fed from the AC line. but they are obvious when supplied directly from a
The density and the refractive index for various compositions of heavy metal fluoride(HMF) glasses,used to make low-loss optical wave-guides,have been measured