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用x—射线形貌法和透射电子显微术(以下简称TEM)研究了MCT晶体的缺陷结构。采用这两种技术揭示和鉴别了亚晶粒间界,计算出其倾斜角为10~(-3)弧度。由TEM
The defect structure of MCT crystals was investigated by x-ray topography and transmission electron microscopy (TEM). Using these two techniques to reveal and identify the subgrain boundaries, calculated its tilt angle of 10 ~ (-3) radian. By TEM