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[期刊论文] 作者:Shreeniket Joshi,Amirkianoosh Kiani, 来源:光电进展(英文版) 年份:2021
The aim of this study is to develop a reliable method to determine optical constants for 3D-nanonetwork Si thin films manufactured using a pulsed-laser ablation technique that can be applied to other materials synthesized by this tech-nique......
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