A scanned-cantilever atomic force microscope (AFM) with large scanning range is proposed, which adopts a new design name......

提出了一种用于针尖扫描原子力显微镜(AFM)的光点跟踪设计方案,结构简单,容易实现。设计方案对扫描器的负载能力要求不高,而且能使......