【摘 要】
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The reliability,useful operating life time and luminous flux are basically determined by the junction temperature of an LED device,therefore the life time and reliability of the final SSL application
【机 构】
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Mentor Graphics Mechanical Analysis Division MicReD Inforpark D,Gábor Dénes utca 2,Budapest,H-1117 H
论文部分内容阅读
The reliability,useful operating life time and luminous flux are basically determined by the junction temperature of an LED device,therefore the life time and reliability of the final SSL application (such street lighting luminaire,cars’ head lights,etc) as well.And this temperature is directly proportional to the total junction-to-ambient thermal resistance of the heat-flow path of the LED application.This paper provides an overview of the application possibilities of the thermal transient testing of LEDs (using the latest applicable JEDEC standards) in component level characterization as well as during product design,including options of die attach testing,in-situ TIM testing,during life time testing and luminaire level design and testing.
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